BH GSO IEC 60749-16:2016
IEC 60749-16:2003
Bahraini Standard
Current Edition
·
Approved on
08 February 2016
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
BH GSO IEC 60749-16:2016 Files
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BH GSO IEC 60749-16:2016 Scope
The purpose of this part of IEC 60749 is to detect the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).
The test of particle impact noise detection is classified as non-destructive.
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