BH GSO IEC 62373:2016
IEC 62373:2006
Bahraini Standard
Current Edition
·
Approved on
08 February 2016
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
BH GSO IEC 62373:2016 Files
English
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Current Edition
Reference Language
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BH GSO IEC 62373:2016 Scope
This International Standard provides a test procedure for a bias-temperature (BT) stability test
of metal-oxide semiconductor, field-effect transistors (MOSFET).
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