BH GSO IEC 62373:2016

IEC 62373:2006
Bahraini Standard   Current Edition · Approved on 08 February 2016

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

BH GSO IEC 62373:2016 Files

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Current Edition Reference Language

BH GSO IEC 62373:2016 Scope

This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).

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