This report specifies a simple method of measuring load resonance frequency fL and load resonance resistance RL in the frequency range up to 30 MHz. These measurements allow calculation of load resonance frequency offset AfL, frequency pulling range AfL1, L2 and pulling sensitivity S as described in Amendment No. 1 to IEC Publication 122-1. The method uses the change in resonance frequency from f^. to fL (i.e. AfL) which occurs when a load capacitance CL is inserted in series with the crystal unit. The accuracy is determined mainly by the precision of the frequency measurement and the calibration of the load capacitor. Measurement of load resonance frequency fL with different load capacitances may be used for the determination of C1 and L1 as defined in IEC Publication 302. It should be noted that when making measurements of the load resonance frequency of a quartz crystal unit, the accuracy obtainable is a function of the crystal unit design and the value of the load capacitance, as well as the method of measurement. Useful information of general interest can be found in IEC Publication 122-2.