BH GSO IEC 60749-3:2016
IEC 60749-3:2002
Bahraini Standard
Current Edition
·
Approved on
08 February 2016
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection
BH GSO IEC 60749-3:2016 Files
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BH GSO IEC 60749-3:2016 Scope
The purpose of this part of IEC 60749 is to verify that the materials, design, construction markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance, or both.
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