GSO IEC 60749-20:2015
IEC 60749-20:2008
Gulf Standard
Historical
·
Approved on
03 September 2015
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
GSO IEC 60749-20:2015 Files
English
53 Pages
Historical
Reference Language
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GSO IEC 60749-20:2015 Scope
This part of IEC 60749 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive.
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