ISO 24688:2022

International Standard   Current Edition · Approved on 22 July 2022

Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods

ISO 24688:2022 Files

English 8 Pages
Current Edition
BHD 31.34

ISO 24688:2022 Scope

This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).

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