ISO 23170:2022
International Standard
Current Edition
·
Approved on
15 June 2022
Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
ISO 23170:2022 Files
English
29 Pages
Current Edition
73.24 BHD
ISO 23170:2022 Scope
This document specifies a method for the quantitative depth profiling of amorphous heavy metal oxide ultrathin films on Si substrates using medium energy ion scattering (MEIS).
Best Sellers
GSO 150-2:2013
Gulf Standard
Expiration dates for food products - Part 2 :
Voluntary expiration dates
BH GSO 150-2:2015
GSO 150-2:2013
Bahraini Standard
Expiration dates for food products - Part 2 :
Voluntary expiration dates
BH GSO 2055-1:2016
GSO 2055-1:2015
Bahraini Technical Regulation
HALAL FOOD - Part 1 : General Requirements
GSO 2055-1:2015
Gulf Technical Regulation
HALAL FOOD - Part 1 : General Requirements
Recently Published
ISO 3095:2025
International Standard
Railway applications — Acoustics — Measurement of noise emitted by railbound vehicles
ISO 16681:2025
International Standard
Ships and marine technology — Pilot transfer arrangements — Ship hull securing equipment
ISO 10280:2025
International Standard
Steel and iron — Determination of titanium content — Diantipyrylmethane spectrophotometric method
ISO 37009:2025
International Standard
Conflict of interest in organizations — Guidance